Compare a sample to a reference image
TAGARNO Image comparison application enables you to inspect a sample to a reference image in multiple ways directly from your TAGARNO digital microscope. The application offers features such as capturing the reference image, live view with superimposed reference image, comparing images side by side, split view and others. This app was developed for the electronics industry to compare PCB samples but can be used in other industries where controlling quality to a reference image is vital.
How does it work?
Watch the video below to see the TAGARNO image comparison in action.
- Capture reference image and place fix points
- Live view with superimposed reference image
- Capture sample image which will be auto-aligned to the reference image
- Capture sample image without aligning to reference image
- View reference image
- View sample image
- Compare images by switching between them with a 1 second interval
- Compare images side-by-side
- Adjustable vertical split view
- Save reference image
- Save sample image
- Standalone microscope - No computer needed
The application is installed directly on the microscope with no need for an external computer connected to the visual inspection microscope. All you need is a mouse connected directly to your microscope and quick installation plus activation of the software and you are good to go!
- User friendly interface
Benefit from an easy to use and intuitive menu. Manage shortcuts, save templates and many other seamless options in a user friendly interface.
- Document your work
Save your file in different formats, with or without graphics, on an usb or even directly on your computer via LAN. . Ability to toggle between live view and still image mode as well as capturing images and saving your work to USB memory stick with or without applied graphics.
- Quarterly updates
Benefit from quarterly updates and receive the latest measurement tools and features on your digital microscope applications. Easily purchase another application that can help your inspection without having to change your microscope.