Create ultra sharp images documentation without blurred areas
Focus application from TAGARNO allows you to easily create high quality documentation images by capturing images of the sample on different focus heights and then merging them into one final image documentation. By choosing the furthest and nearest point of focus, the microscope can capture up to 50 pictures of the sample and afterwards converting them into one single image file.
This application is installed and ready to use by default in FHD PRESTIGE and FHD TREND. On TAGARNO FHD UNO the application is preinstalled, but an additional license key must be purchased to activate it.
How does it work?
Watch the video below to see the TAGARNO focus stacking in action.
- Focus settings (far and near)
Set up your furthest and nearest point of focus in your sample to ensure the best results for your documentation.
Determine the number of steps you want the application to perform. Higher steps will capture more images and create the documentation in higher detail
- Quality adjustment
- Magnification level
- Standalone microscope - No computer needed
The application is installed directly on the microscope with no need for an external computer connected to the visual inspection microscope. All you need is a mouse connected directly to your microscope and quick installation plus activation of the software and you are good to go!
- User friendly interface
Benefit from an easy to use and intuitive menu. Manage shortcuts, save templates and many other seamless options in a user friendly interface.
- Document your work
Save your file in different formats, with or without graphics, on an usb or even directly on your computer via LAN. . Ability to toggle between live view and still image mode as well as capturing images and saving your work to USB memory stick with or without applied graphics.
- Quarterly updates
Benefit from quarterly updates and receive the latest measurement tools and features on your digital microscope applications. Easily purchase another application that can help your inspection without having to change your microscope.